Vol. 320, Issue 1, 2020January 01, 2020 EDT
Crystal Surface Reactivity Analysis Using a Combined Approach of X-ray Micro-Computed Tomography and Vertical Scanning Interferometry
Crystal Surface Reactivity Analysis Using a Combined Approach of X-ray Micro-Computed Tomography and Vertical Scanning Interferometry
Wolf-Achim Kahl, Tao Yuan, Till Bollermann, Wolfgang Bach, Cornelius Fischer,
Kahl, W.-A., Yuan, T., Bollermann, T., Bach, W., & Fischer, C. (2020). Crystal Surface Reactivity Analysis Using a Combined Approach of X-ray Micro-Computed Tomography and Vertical Scanning Interferometry. American Journal of Science, 320(1), 27–52. https://doi.org/10.2475/01.2020.03