P-ISSN 0002-9599
E-ISSN 1945-452X
Vol. 305, Issue 6-8, 2005June 01, 2005 EDT
Quantifying the Relationship Between Microbial Attachment and Mineral Surface Dynamics Using Vertical Scanning Interferometry (VSI)
Quantifying the Relationship Between Microbial Attachment and Mineral Surface Dynamics Using Vertical Scanning Interferometry (VSI)
Davis, K. J., & Lüttge, A. (2005). Quantifying the Relationship Between Microbial Attachment and Mineral Surface Dynamics Using Vertical Scanning Interferometry (VSI). American Journal of Science, 305(6–8), 727–751. https://doi.org/10.2475/ajs.305.6-8.727